Katari M, Venkatasubbu S, Krishnamoorthy G. Integration of Artificial Intelligence for Real-Time Fault Detection in Semiconductor Packaging. J. Knowl. Learn. Sci. Technol. [网际网络]. 2023年12月30日 [见引于 2026年9月7日];2(3):473-95. 载于: https://jklst.org/index.php/home/article/view/184