WANG, Shikai; CHEN, Jingyi; YAN, Lei; SHUI, Zuwei. Automated Test Case Generation for Chip Verification Using Deep Reinforcement Learning. Journal of Knowledge Learning and Science Technology ISSN: 2959-6386 (online), [S. l.], v. 4, n. 1, p. 1–12, 2025. DOI: 10.60087/jklst.v4.n1.001. Disponível em: https://jklst.org/index.php/home/article/view/277.. Acesso em: 13 jan. 2025.